Han C. Y., Liu Y.*, Liu Y. R., et al. Negative Gate Bias Stress Effects on Conduction and Low Frequency Noise Characteristics in Poly-Si Thin-Film Transistors. Chinese Physics B. 2019, 28(8): 088502
点击次数：
是否译文：否
上一条： Han C. Y., Liu Y.*, Liu Y. R., et al. Negative Gate Bias Stress Effects on Conduction and Low Frequency Noise Characteristics in Poly-Si Thin-Film Transistors. Chinese Physics B. 2019, 28(8): 088502
下一条： Liu Y., Chen H. B., Liu Y. R., et al. Low Frequency Noise and Radiation Response in the Partially Depleted SOI MOSFETs with Ion Implanted Buried Oxide. Chinese Physics B. 2015, 24(8): 088503.