广东工业大学教师主页平台管理系统 Liu Yuan--Home-- Han C. Y., Liu Y.*, Liu Y. R., et al. Negative Gate Bias Stress Effects on Conduction and Low Frequency Noise Characteristics in Poly-Si Thin-Film Transistors. Chinese Physics B. 2019, 28(8): 088502

刘远

教授

Supervisor of Doctorate Candidates

Supervisor of Master's Candidates

Date of Birth:1984-11-26

Date of Employment:2018-07-06

School/Department:集成电路学院

Education Level:博士

Gender:Male

Degree:Doctor of Engineering

Status:On-the-job

Discipline:微电子学与固体电子学
电路与系统
控制理论与控制工程

Honors and Titles:

2017-05-15 广州市珠江科技新星

2019-02-15 IEEE Senior Member

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Han C. Y., Liu Y.*, Liu Y. R., et al. Negative Gate Bias Stress Effects on Conduction and Low Frequency Noise Characteristics in Poly-Si Thin-Film Transistors. Chinese Physics B. 2019, 28(8): 088502

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Pre One:Chen R. S., Deng S. B., Liu Y.*, et al. Investigation of top gate GaN thinfilm transistor fabricated by DC magnetron sputtering. Journal of Vacuum Science and Technology B. 2018, 36(3): 032203 Next One:Wang L., Liu Y.*, Geng K. W., et al. Degradation of I-V and Low Frequency Noise Characteristics under Negative Bias Illumination Stress in the InZnO Thin Film Transistors. Chinese Physics B. 2018, 27(6):068504