广东工业大学教师主页平台管理系统 Liu Yuan--Home-- Liu Y., Wu W. J., Qiang L., et al. Temperature Dependence of Electrical Properties in Indium Zinc Oxide Thin Film Transistors. Chinese Physics Letters. 2015, 32(8): 088506.

刘远

教授

Supervisor of Doctorate Candidates

Supervisor of Master's Candidates

Date of Birth:1984-11-26

Date of Employment:2018-07-06

School/Department:集成电路学院

Education Level:博士

Gender:Male

Degree:Doctor of Engineering

Status:On-the-job

Discipline:微电子学与固体电子学
电路与系统
控制理论与控制工程

Honors and Titles:

2017-05-15 广州市珠江科技新星

2019-02-15 IEEE Senior Member

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Liu Y., Wu W. J., Qiang L., et al. Temperature Dependence of Electrical Properties in Indium Zinc Oxide Thin Film Transistors. Chinese Physics Letters. 2015, 32(8): 088506.

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Pre One:Liu Y., Liu K., Chen R., et al. Total-Ionizing-Dose Radiation Effects in the P-type Polycrystalline Silicon Thin Film Transistors. Chinese Physics Letters. 2017, 34(1): 018501 Next One:Chen Y. Y., Ren Y., Liu Y.*, et al. Temperature Dependence of Conduction and Low Frequency Noise Characteristics in GaN Schottky Barrier Diodes. Modern Physics Letters B. 2020. Accept