广东工业大学教师主页平台管理系统 Liu Yuan--Home-- Liu Y., He H. Y., Chen R. S., et al. Analysis and Simulation of Low Frequency Noise in the Indium Zinc Oxide Thin Film Transistors. IEEE Journal of the Electron Devices Society. 2018, 6(1): 271-279

刘远

教授

Supervisor of Doctorate Candidates

Supervisor of Master's Candidates

Date of Birth:1984-11-26

Date of Employment:2018-07-06

School/Department:集成电路学院

Education Level:博士

Gender:Male

Degree:Doctor of Engineering

Status:On-the-job

Discipline:微电子学与固体电子学
电路与系统
控制理论与控制工程

Honors and Titles:

2017-05-15 广州市珠江科技新星

2019-02-15 IEEE Senior Member

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Liu Y., He H. Y., Chen R. S., et al. Analysis and Simulation of Low Frequency Noise in the Indium Zinc Oxide Thin Film Transistors. IEEE Journal of the Electron Devices Society. 2018, 6(1): 271-279

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Pre One:Liu Y., Cai S. T., Han C. Y., et al. Scaling Down Effect on Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors. IEEE Journal of the Electron Devices Society. 2019, 7(1): 203-207 Next One:Zhong W., Yao R. H., Liu Y.*, et al. Effect of Self-Assembled Monolayers (SAMs) as Surface Passivation on the Flexible a-InSnZnO Thin-Film Transistors. IEEE Transaction on Electron Device. 2020, 67(8): 3157-3162