广东工业大学教师主页平台管理系统刘远--中文主页-- Liu Y., Liu Y. R., He Y. J., et al. Low Frequency noise in the MOSFETs Processed in 65 nm Technology. Journal of Semiconductors. 2016, 37(6): 064012

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Liu Y., Liu Y. R., He Y. J., et al. Low Frequency noise in the MOSFETs Processed in 65 nm Technology. Journal of Semiconductors. 2016, 37(6): 064012

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