Liu K., Liu Y.*, Liu Y. R., et al. Comparative Study of Mobility Extraction Methods in P-type Polycrystalline Silicon Thin Film Transistors. Modern Physics Letters B. 2017, 31(19-21): 1740004
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上一条： Liu Y., En Y. F., and Fang W. X. Analysis of low frequency noise characteristics in p-type polycrystalline silicon thin film transistors. Modern Physics Letters B. 2017, 31(19-21): 1740020
下一条： Yue L, Yang S. H., Liu Y.*, et al. 170 keV Proton radiation effects on lowfrequency noise of bipolar junction transistors. Radiation Effects and Defects in Solids. 2017, 172(3-4): 313-322