Liu Y., Wang L., Cai S. T., et al. Temperature Dependence of the Electrical Characteristics in Indium-Zinc-Oxide Thin Film Transistors from 10 to 400 K. Chinese Physics Letters. 2018, 35(9): 098502
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上一条： Liu Y., Chen H. B., Liu Y. R., et al. Low Frequency Noise and Radiation Response in the Partially Depleted SOI MOSFETs with Ion Implanted Buried Oxide. Chinese Physics B. 2015, 24(8): 088503.
下一条： Chen Y. Y., Liu Y.*, Wu. Z. H., et al. Low Frequency Noise in Amorphous Indium Zinc Oxide Thin Film Transistor with Aluminum Oxide Gate Insulator. Chinese Physics Letters. 2018, 35(4): 048502